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Introduction to Advanced System-On-Chip Test Design and Optimization
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Introduction to Advanced System-On-Chip Test Design and Optimization Brochura - 2011

por Erik Larsson

Informações do editor

SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The final part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Intended for graduate students and PhD-students working in the test field, the manual also aids researchers and professors who would like to get into the area of SOC testing.

Detalhes

  • Título Introduction to Advanced System-On-Chip Test Design and Optimization
  • Autor Erik Larsson
  • Encadernação Brochura
  • Edição Softcover reprin
  • Páginas 388
  • Volumes 1
  • Idioma ENG
  • Editorial Springer
  • Data de publicação 2011-02-02
  • ISBN 9781441952691 / 1441952691
  • Peso 1.26 libras (0.57 kg)
  • Dimensão 9.21 x 6.14 x 0.84 in. (23.39 x 15.60 x 2.13 cm)
  • Dewey Decimal Code 621.381

Sobre o autor

Dr. Erik Larsson is an assistant professor at Linkpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies

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Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization

por Erik Larsson

  • Novo
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ISBN 10 / ISBN 13
9781441952691 / 1441952691
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Este vendedor ganhou uma avaliação de 5 de 5 estrelas de Biblio clientes.
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Descrição:
New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Introduction to Advanced System-on-Chip Test Design and Optimization.
Preço do item
€ 160,06
€ 9,55 frete para USA
Introduction to Advanced System-on-Chip Test Design and Optimization
Foto de Stock: A capa pode ser diferente.

Introduction to Advanced System-on-Chip Test Design and Optimization

por Erik Larsson

  • Novo
  • Brochura
Condição
Novo
Encadernação
Paperback
ISBN 10 / ISBN 13
9781441952691 / 1441952691
Quantidade Disponível
2
Livreiro
Exeter, Devon, United Kingdom
Avaliação do vendedor:
Este vendedor ganhou uma avaliação de 4 de 5 estrelas de Biblio clientes.
Preço do item
€ 206,44
€ 11,95 frete para USA

Mostrar detalhes

Descrição:
Springer US, 2005. Paperback. New. 388 pages. 9.20x6.20x1.20 inches.
Preço do item
€ 206,44
€ 11,95 frete para USA